NEAR FIELD PROBE, HIGH FREQUENCY DIELECTRIC CONSTANT MEASURING DEVICE EQUIPPED WITH THE NEAR FIELD PROBE, AND REPLACEMENT COMPONENT OF NEAR FIELD PROBE

摘要

PROBLEM TO BE SOLVED: To provide a near field probe which can attain a high resolution, while maintaining a near field having a sufficient strength for measurement, a high frequency dielectric constant measuring device equipped with this probe and a replacement component of the near field probe.;SOLUTION: A minute shaft part 121 includes an outer peripheral surface 21a of which the diameter is smaller than that of an inner conductor 20, and is provided at the tip of the inner conductor 20 so that it projects from the body 22 of the inner conductor along the central axis C. A minute opening 35 which makes an internal space S communicate with the outside along the central axis C, through which the minute shaft part 121 can be inserted and of which the diameter is smaller than a wavelength of the resonance frequency of resonance, is provided on the tip side of an outer conductor 30. The relative positions of the minute shaft part 121 and the minute opening 35 are set so that the minute shaft part 121 is inserted through the minute opening 35 without contacting with the outer conductor 30 and that the tip of the shaft part is put on the same plane as the outer surface of the outer conductor 30 or slightly projects outward from the outer surface.;COPYRIGHT: (C)2009,JPO&INPIT