首页> 外国专利> WAVEFRONT ABERRATION INSPECTION APPARATUS, OPTICAL PICKUP ASSEMBLY ADJUSTMENT DEVICE, LENS EVALUATION DEVICE, LENS ASSEMBLY DEVICE, OBJECTIVE LENS ACTUATOR ASSEMBLY ADJUSTMENT DEVICE, OPTICAL PICKUP, OPTICAL DISK DRIVE, AND OPTICAL INFORMATION RECORDING AND REPRODUCING DEVICE

WAVEFRONT ABERRATION INSPECTION APPARATUS, OPTICAL PICKUP ASSEMBLY ADJUSTMENT DEVICE, LENS EVALUATION DEVICE, LENS ASSEMBLY DEVICE, OBJECTIVE LENS ACTUATOR ASSEMBLY ADJUSTMENT DEVICE, OPTICAL PICKUP, OPTICAL DISK DRIVE, AND OPTICAL INFORMATION RECORDING AND REPRODUCING DEVICE

机译:波形像差检查仪,光学拾取组件调整设备,镜头评估设备,透镜组件执行器,目标透镜执行器组件调整设备,光学拾取器,光学光盘驱动器和光学记录

摘要

PROBLEM TO BE SOLVED: To provide an optical pickup wavefront aberration inspection apparatus highly accurately measuring an optical pickup having satisfactory aberration performance in a short period of time by a simple optical system, to provide an optical pickup assembly adjustment device and to provide a lens evaluation device, a lens assembly device and an objective lens actuator assembly adjustment device for the optical pickup.;SOLUTION: In the wavefront aberration inspection apparatus, a position in the horizontal direction of the optical pickup is adjusted to minimize the tilt component of a phase wavefront of light emitted from the optical pickup detected by the wavefront aberration detection means, to measure the wavefront aberration of the light emitted from the optical pickup. Thereby, e.g. an optical pickup wavefront measuring device for highly accurately measuring wavefront aberration of the light emitted from the optical pickup can be constituted with a simple system and alignment in a horizontal direction during aberration measurement can be performed in a short period of time.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种通过简单的光学系统在短时间内高精度地测量具有令人满意的像差性能的光学拾取器的波前像差检查设备,提供一种光学拾取器组件调节装置并提供透镜评估解决方案:在波前像差检查设备中,调整光拾取器在水平方向上的位置,以最大程度地减小相位波前的倾斜分量。利用由波前像差检测装置检测出的光拾取器发出的光的波前像差,来测量从光拾取器发出的光的波前像差。从而,例如可以通过简单的系统构成用于高精度地测量从光学拾取器发出的光的波阵面像差的光学拾取器波阵面测量装置,并且可以在短时间内进行像差测量期间的水平方向的对准。 C)2009,日本特许厅

著录项

  • 公开/公告号JP2009110639A

    专利类型

  • 公开/公告日2009-05-21

    原文格式PDF

  • 申请/专利权人 PANASONIC CORP;

    申请/专利号JP20080245830

  • 申请日2008-09-25

  • 分类号G11B7/22;G11B7/08;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:41

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