首页> 外国专利> HELIUM LEAK DETECTOR AND ADJUSTMENT METHOD FOR VOLTAGE APPLIED TO CORRECTION ELECTRODE PROVIDED ON THE SAME HELIUM LEAK DETECTOR

HELIUM LEAK DETECTOR AND ADJUSTMENT METHOD FOR VOLTAGE APPLIED TO CORRECTION ELECTRODE PROVIDED ON THE SAME HELIUM LEAK DETECTOR

机译:氦泄漏检测器及在同一氦泄漏检测器上提供的校正电极上的电压调整方法

摘要

PROBLEM TO BE SOLVED: To provide a helium leak detector of high measurement accuracy by preventing detection sensitivity from lowering.;SOLUTION: A correction electrode 18 is provided in a position with ions such as CmHn ions heavier than He ions applied thereto. The correction electrode 18 is insulated from an intermediate barrier plate 13, etc. within an analyzer tube 10. The correction electrode 18 is connected to a power supply 111. As to the power supply 111, the voltage value of a voltage applied to the correction electrode 18 is variable. The power supply 111 is used to apply a voltage (of -70 to 0 V, for example) to the correction electrode 18 so as to cancel electrostatic force exerted on a deflection track A by carbon deposited within the analyzer tube 10. This makes it possible to prevent the deflection track A of the He ions from being deformed.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:通过防止检测灵敏度的降低来提供一种具有高测量精度的氦泄漏检测器;解决方案:校正电极18设置在具有C m H n 离子比He离子施加的离子重。校正电极18与分析管10内的中间隔板13等绝缘。校正电极18连接至电源111。电源111是施加于校正的电压的电压值。电极18是可变的。电源111用于向校正电极18施加(例如,-70至0V的)电压,以消除由沉积在分析管10内的碳施加在偏转轨迹A上的静电力。有可能防止He离子的偏转轨迹A变形。;版权所有:(C)2009,日本特许厅

著录项

  • 公开/公告号JP2008281432A

    专利类型

  • 公开/公告日2008-11-20

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP20070125762

  • 发明设计人 IGAWA AKIO;

    申请日2007-05-10

  • 分类号G01N27/62;G01M3/20;H01J49/30;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:11

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号