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Micro hardness measurement method and micro hardness tester
Micro hardness measurement method and micro hardness tester
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机译:显微硬度测量方法和显微硬度计
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摘要
PROBLEM TO BE SOLVED: To provide a microhardness measuring method optimum for measuring the hardness of a surface layer (thin film), capable of finding easily and precisely the hardness of a sample dominant in elastic deformation, in particular, the sample formed with a hard surface layer on a surface of a soft base material, and capable of calculating the hardness of a sample formed with a hard surface layer of forming only a micro impression.;SOLUTION: This microhardness measuring method for forming the impression by pushing an indenter 6 into the sample 9 formed with the hard surface layer 9b on the base material 9a, to calculate the hardness, includes a loading process for measuring the maximum load LO loaded to the indenter 6, and the maximum push-in amount M of the indenter 6 from the surface of the sample 9, an unloading process for measuring a raised amount B of the indenter 6 from the surface of the sample 9, when a load applied to the indenter 6 comes to zero, a calculation process for calculating am impression depth , based on the maximum push-in amount M and the raised amount B, and a hardness computation process for computing the hardness, based on the impression depth and the maximum load LO.;COPYRIGHT: (C)2008,JPO&INPIT
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机译:解决的问题:提供一种最适合于测量表面层(薄膜)硬度的显微硬度测量方法,该方法能够轻松,精确地找到弹性变形占优势的样品(特别是硬质样品)的硬度。解决方案:这种微硬度测量方法是通过将压头6推入其中来形成压痕,该软硬度测量方法可以计算由仅形成微压痕的硬表面层形成的样品的硬度。为了计算硬度,在基体材料9a上形成有硬质表面层9b的样品9包括一个加载过程,用于测量加载到压头6上的最大载荷L O Sub>和从样品9的表面压入压头6的量 M Sub>,用于测量从样品9的表面压入压头6的升高量 B Sub>的卸载过程。当压力施加到压头上时图6中的零变为零,基于最大压入量 M Sub>和上升量 B Sub>来计算am印深的计算过程,以及用于计算的硬度计算过程。硬度,取决于压印深度和最大载荷L O Sub> 。;版权:(C)2008,JPO&INPIT
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