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Defective pixel detection equipment, defective pixel detection method, and defective pixel detection program

机译:缺陷像素检测设备,缺陷像素检测方法和缺陷像素检测程序

摘要

PPROBLEM TO BE SOLVED: To provide an apparatus, a method, and a program capable of detecting a defective pixel with higher accuracy in defective pixel detection, in which a defect is detected for each pixel aligned on a light receiving surface of an imaging device. PSOLUTION: The defective pixel detecting apparatus comprises a threshold setting means for establishing a threshold for an output value of each pixel signal, a pixel discriminating means for comparing the established threshold with the output value of each pixel signal and discriminating a pixel outputting its output value either higher than or low than the threshold, and a defect determining means for comparing discrimination result of a target pixel, which is judged whether it is a defective pixel or not, with all of discrimination results of a plurality pixels adjacent to the target pixel and aligned continuously, and for determining the target pixel as a defective one if only the discrimination result of the target pixel differs from others. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:

要解决的问题:提供一种能够在缺陷像素检测中以更高的精度检测缺陷像素的装置,方法和程序,其中针对在像素的光接收表面上排列的每个像素检测缺陷。成像设备。

解决方案:缺陷像素检测设备包括:阈值设置装置,用于为每个像素信号的输出值确定阈值;像素鉴别装置,用于将所建立的阈值与每个像素信号的输出值进行比较,并鉴别像素输出。其输出值高于或低于阈值,以及缺陷确定装置,用于将被判断为缺陷像素的目标像素的辨别结果与与像素相邻的多个像素的所有辨别结果进行比较。如果目标像素的辨别结果与其他像素不同,则将目标像素连续对准,并确定目标像素为缺陷像素。

版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4272975B2

    专利类型

  • 公开/公告日2009-06-03

    原文格式PDF

  • 申请/专利权人 HOYA株式会社;

    申请/专利号JP20030407097

  • 发明设计人 高橋 正;

    申请日2003-12-05

  • 分类号H04N5/335;H04N5/232;

  • 国家 JP

  • 入库时间 2022-08-21 19:38:07

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