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Signal formation device, periodic signal observation system and integrated circuit, periodic signal observation method and method of exam of integrated circuit

机译:信号形成装置,周期信号观察系统及集成电路,周期信号观察方法及集成电路检查方法

摘要

Through I/O in order to observe the specified periodic signal inside the LSI circuit being the signal formation device which forms the signal for plural periodic observations which is output outside the said LSI circuit inside the LSI circuit, the aforementioned periodic signal at specified dividing ratio giving specified phase difference to the signal which dividing is done in the dividing circuit and the aforementioned dividing circuit which dividing it does, it has with the delay circuit in order to obtain the plural signals where phase differs mutually.
机译:通过I / O,为了观察作为形成在LSI电路内部的所述LSI电路的外部输出的用于多次周期性观察的信号的信号形成装置的LSI电路内部的规定的周期性信号,以规定的分频比进行上述的周期性信号。为了在相位分割电路中进行分割的信号及上述分割电路进行的分割电路赋予规定的相位差,为了得到相位互不相同的多个信号,该延迟电路具有延迟电路。

著录项

  • 公开/公告号JPWO2007091322A1

    专利类型

  • 公开/公告日2009-06-25

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20070557714

  • 发明设计人 秋谷 定則;

    申请日2006-02-09

  • 分类号G01R31/28;

  • 国家 JP

  • 入库时间 2022-08-21 19:37:53

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