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Epi-fluorescence and reflection contrast observable microscope and how to use the microscope

机译:Epi荧光和反射对比可观察显微镜以及如何使用显微镜

摘要

PROBLEM TO BE SOLVED: To provide a microscope which enables reflection contrast lighting observation by using a unit of a epifluorescent lighting device in common and only making simple constitution alternations.;SOLUTION: An intermediate optical system is arranged between a light source which lights up a sample and an objective, and the intermediate optical system comprises a relay optical system, an aperture stop member, an exciting filter element which transmits an exciting component of the illumination light of the light source, a reflecting optical element which guides the exciting component to the sample, limits exciting light of reflected light reflected by the sample, and guides the remaining fluorescent light to an observation system, and a barrier filter element which cuts light wavelength components other than fluorescent light from the reflecting optical element and transmits the fluorescent light.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种显微镜,该显微镜能够通过使用共同使用落射荧光照明设备的单元来进行反射对比照明观察,并且仅进行简单的结构更改。中间光学系统包括中继光学系统,孔径光阑部件,使光源的照明光的激发成分透射的激发滤光元件,将激发成分引导至反射镜的反射光学元件。样品,限制由样品反射的反射光的激发光,并将剩余的荧光引导至观察系统,以及阻挡滤光器元件,其阻挡来自反射光学元件的除荧光之外的光波长分量并透射荧光。版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP4228134B2

    专利类型

  • 公开/公告日2009-02-25

    原文格式PDF

  • 申请/专利权人 株式会社ニコン;

    申请/专利号JP20020319257

  • 发明设计人 佐瀬 一郎;利光 邦夫;

    申请日2002-11-01

  • 分类号G02B21/06;G02B21/12;G02B21/16;

  • 国家 JP

  • 入库时间 2022-08-21 19:37:42

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