Being improvement test and calibration in the automatic test equipment

摘要

In one embodiment, the circuit of the multi-channel tester, and a switching matrix coupling the central resource to the plurality of outputs via a central resource, and a plurality of outputs, a selectable plurality of channels at least. Each of the selectable channels, I have a PIN diode coupled in a half-bridge configuration. Bias source of the first bias source to the second bias source and a third, forward biasing the PIN diodes are. Each bias source of the first bias source and the second is coupled to the output coupling terminal and the central resource-bound terminal of the half-bridge. Bias source and the third, is coupled to the common node. The bias source and the second bias source, the first and, to provide an output that is substantially balanced, the sum of the output of the bias source and the second bias source of the first, the output of the bias source of the third configured to equilibrium almost against. In some embodiments, a selectable plurality of channels comprises the same bias source first. In some embodiments, each of a plurality of channels, there is provided a bias source different second. In some embodiments, the pin electronics driver, there are things that can be used as a bias source of the second. In some embodiments, the bias source of the third single, via one of the plurality of switches, there are those capable of binding to each of the common node of selectable channels. In some embodiments, there is one that can be placed near and at the terminals of the central resource channel, and the vicinity of the output pin terminal of the channel, a PIN diode, more accurate, more complete, by which the voltage / timing measurements it is possible to.