首页> 外国专利> Vertical and horizontal small angle X-ray scattering apparatus and small angle X-ray scattering measuring method

Vertical and horizontal small angle X-ray scattering apparatus and small angle X-ray scattering measuring method

机译:纵横小角度X射线散射装置及小角度X射线散射测定方法

摘要

Provided is a small-angle X-ray scattering apparatus capable of performing a plurality of X-ray diffraction measurements such as transmission small-angle X-ray diffraction, reflection small-angle X-ray diffraction, and in-plane small-angle X-ray diffraction. X-ray generator 11, optical system 16 that forms X-rays into a predetermined X-ray incident beam, sample holder 120 that mounts a sample to be measured and irradiates the X-ray incident beam, and small-angle scattered X from the sample A vacuum path 17 that passes through the line, and an X-ray detector 18 that detects small-angle scattered X-rays that have passed through the vacuum path. The sample holder is fixed to the support 110, and an X-ray generator, an optical system, A vertical / horizontal small-angle X-ray scattering apparatus that allows a plurality of small-angle X-ray scattering measurements to be performed by attaching a vacuum path and an X-ray detector on the bench 100 and being rotatable about the sample holder.
机译:本发明提供一种小角度X射线散射装置,其能够进行透射小角度X射线衍射,反射小角度X射线衍射,面内小角度X等多次X射线衍射测定。射线衍射。 X射线产生器11,将X射线形成预定的X射线入射束的光学系统16,载置被测定样品并照射X射线入射束的样品保持器120,以及从X射线发生器11入射的小角度散射X。样品通过该线的真空路径17和检测通过该真空路径的小角度散射X射线的X射线检测器18。样品架被固定到支撑件110,并且X射线发生器,光学系统,垂直/水平小角度X射线散射设备允许通过以下方式执行多个小角度X射线散射测量:在工作台100上安装真空路径和X射线检测器,并且可绕样品架旋转。

著录项

  • 公开/公告号JPWO2007026461A1

    专利类型

  • 公开/公告日2009-03-26

    原文格式PDF

  • 申请/专利权人 株式会社リガク;

    申请/专利号JP20070533127

  • 发明设计人 岩崎 吉男;

    申请日2006-07-04

  • 分类号G01N23/201;

  • 国家 JP

  • 入库时间 2022-08-21 19:37:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号