首页> 外国专利> Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering

Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering

机译:垂直/水平小角X射线散射装置和测量小角X射线散射的方法

摘要

A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle scattered X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus 11 for generating X-ray, an optic system 16 for forming the X-ray into a predetermined incident beam of X-ray, a sample holder portion 120 for mounting a sample to be measured thereon, to irradiate the incident beam of X-ray thereupon, a vacuum path 17 for passing through small angle scattered X-ray from the sample, and an X-ray detector 18 for detecting the small angle scattered X-ray passing through the vacuum path, wherein the sample holder portion is fixed on a support base 110, while attaching the X-ray generating apparatus, the optic system, the vacuum path and the X-ray detector on a bench 100, as well, to be rotatable around the sample holder portion, and thereby enabling plural numbers of measurements of small angle X-ray scattering.
机译:垂直/水平小角度X射线散射设备,用于进行多种X射线衍射测量,例如透射小角度X射线衍射,反射小角度散射X射线衍射和面内X射线衍射等包括用于产生X射线的X射线发生设备 11 ,用于将X射线形成预定的X入射光束的光学系统 16 -射线,用于在其上安装要测量的样品的样品保持器部分 120 ,以在其上照射X射线的入射光束,真空路径 17 样品的角度散射X射线,以及用于检测通过真空路径的小角度散射X射线的X射线检测器 18 ,其中样品支架部分固定在支撑基座B> 110 ,同时将X射线发生设备,光学系统,真空路径和X射线检测器安装在工作台 100 上,并可以围绕其旋转样品保持器部分,从而能够进行小角度X射线散射的多次测量。

著录项

  • 公开/公告号US8000444B2

    专利类型

  • 公开/公告日2011-08-16

    原文格式PDF

  • 申请/专利权人 YOSHIO IWASAKI;

    申请/专利号US20060064990

  • 发明设计人 YOSHIO IWASAKI;

    申请日2006-07-04

  • 分类号G01N23/201;G01N23/20;

  • 国家 US

  • 入库时间 2022-08-21 18:11:31

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