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METHOD OF MAKING HIGH-FREQUENCY PROBE, PROBE CARD USING THE HIGH-FREQUENCY PROBE

机译:制作高频探针的方法,使用高频探针的探针卡

摘要

A high frequency probe preparation method for making a high frequency probe for high frequency testing to assure signal integrity by means of making a sleeve assembly subject to the size of a predetermined bare needle and then sleeving bare needle by the sleeve assembly to form a high-frequency probe is disclosed to include the steps of: a) providing an insulated tube, and b) forming a conducting layer on the outer surface of the insulated tube which having a metal layer for grounding. The insulated tube and the conducting layer constitute the sleeve assembly. The metal layer is formed by means of physical deposition, chemical deposition, mixture of physical and chemical deposition or electrochemical deposition.
机译:一种高频探针的制备方法,用于制造用于高频测试的高频探针,以确保信号完整性,方法是使套筒组件经受预定裸针的大小的作用,然后通过套筒组件将裸针套上套管以形成高公开了一种频率探头,其包括以下步骤:a)提供绝缘管,以及b)在绝缘管的外表面上形成导电层,该导电层具有用于接地的金属层。绝缘管和导电层构成套筒组件。金属层通过物理沉积,化学沉积,物理和化学沉积的混合或电化学沉积的方式形成。

著录项

  • 公开/公告号US2009212801A1

    专利类型

  • 公开/公告日2009-08-27

    原文格式PDF

  • 申请/专利权人 WEI-CHENG KU;KUAN-CHUN CHOU;

    申请/专利号US20090433952

  • 发明设计人 WEI-CHENG KU;KUAN-CHUN CHOU;

    申请日2009-05-01

  • 分类号G01R1/067;G01R31/02;B05D5/12;C25D5/00;C23C14/34;C25D3/48;C25D3/12;C25D3/00;C25D3/56;

  • 国家 US

  • 入库时间 2022-08-21 19:36:23

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