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Verfahren zur Auswertung und Korrektur von Gesamtmesssignalen

机译:评估和校正总测量信号的过程

摘要

An improved and more accurate method for evaluating and correcting total measurement signals (TS(n)) of measuring devices. The invention concerns a method for evaluating and correcting total measurement signals (TS(n)) of a measuring device, wherein measuring signals are transmitted in the direction of a medium and reflected on a surface of the medium as wanted echo signals or on a surface of a disturbing element as interference signals and received. In the case of a modification of at least one technical, process condition in the container and/or a modification of at least one technical, measurement condition of the measuring device, an independent reference curve is ascertained on the basis of a current static reference curve, wherein the interference signals are masked out of the raw echo curve on the basis of a masking algorithm, which applies the independent reference curve.
机译:一种改进且更准确的方法,用于评估和校正测量设备的总测量信号(TS(n))。本发明涉及一种用于评估和校正测量设备的总测量信号(TS(n))的方法,其中,测量信号在介质的方向上传输,并作为所需的回波信号或在表面上反射在介质的表面上干扰元素作为干扰信号被接收。在改变容器中的至少一种技术处理条件和/或改变测量装置的至少一种技术测量条件的情况下,基于当前的静态参考曲线确定独立的参考曲线。 ,其中基于应用独立参考曲线的屏蔽算法,从原始回波曲线中屏蔽了干扰信号。

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