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System and Method to Determine Chromatic Dispersion in Short Lengths of Waveguides Using a Common Path Interferometer
System and Method to Determine Chromatic Dispersion in Short Lengths of Waveguides Using a Common Path Interferometer
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机译:使用公共路径干涉仪确定短波长色散的系统和方法
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摘要
The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a two wave interference pattern and a common path interferometer. Specifically the invention comprises a radiation source operable to emit radiation connected to a means for separating incident and reflected waves; the means for separating incident and reflected waves possessing an output arm adjacent to a first end of the waveguide; and the means for separating incident and reflected waves further connected to an optical detector operable to record an interference pattern generated by a reflected test emission from the radiation source. The interference pattern consists of two waves: one reflected from a first facet of a waveguide and the second reflected from a second facet of the same waveguide.
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