首页> 外国专利> X-RAY FLUORESCENCE ANALYSIS TO DETERMINE LEVELS OF HAZARDOUS SUBSTANCES

X-RAY FLUORESCENCE ANALYSIS TO DETERMINE LEVELS OF HAZARDOUS SUBSTANCES

机译:X射线荧光光谱法测定有害物质的含量

摘要

An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample 106, comprises a measurement step (S3) of irradiating the sample 106 with X-rays, and measuring the spectrum of the sample 106, and an assay step (S4) of comparing the components of the specific substance in the spectrum of the sample 106 and in a reference spectrum that has been pre-stored for the sample 106, and determining whether the specific substance is contained in the sample 106 in an amount equal to or greater than a specific value.
机译:本发明的目的是在对样品中包含的特定物质进行X射线分析时,缩短处理所需的时间,并且简化工作并增加处理样品的数量。为了实现该目的,一种用于分析样品 106 中特定物质含量的方法包括辐照样品 106的测量步骤(S 3 )。 和X射线,测量样品 106的光谱,以及比较样品中特定物质成分的测定步骤(S 4 )。样品 106 的光谱和已为样品 106 预存储的参考光谱,并确定样品 106中是否包含特定物质等于或大于特定值。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号