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Single wavelength stimulated emission depletion microscopy

机译:单波长激发发射耗尽显微镜

摘要

In apparatus for superresolution microscopy or microlithography, wherein a spot in the specimen to be examined or in the microlithographic medium is raised to an excited state by a first pulse of light, and a second pulse of light reduces the excitation in the peripheral parts of the spot to increase the resolution of the instrument, a method whereby the wavelength of the second pulse in the specimen or medium is the same as the wavelength of the first pulse, thereby allowing the cost and complexity of the apparatus to be lowered.
机译:在用于超分辨率显微术或微光刻的设备中,其中待检查的样品中或微光刻介质中的点被第一光脉冲升高到激发态,而第二光脉冲减少了样品外围的激发。斑点以增加仪器的分辨率,该方法是使样本或介质中第二脉冲的波长与第一脉冲的波长相同,从而降低设备的成本和复杂性。

著录项

  • 公开/公告号US2009121153A1

    专利类型

  • 公开/公告日2009-05-14

    原文格式PDF

  • 申请/专利权人 STEPHEN C. BAER;

    申请/专利号US20060795094

  • 发明设计人 STEPHEN C. BAER;

    申请日2006-01-17

  • 分类号G01J1/58;A61N5/06;

  • 国家 US

  • 入库时间 2022-08-21 19:35:38

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