首页> 外国专利> Wiring model library constructing device and constructing method, and layout parameter extracting device and extracting method

Wiring model library constructing device and constructing method, and layout parameter extracting device and extracting method

机译:布线模型库的构建装置和构建方法,布局参数提取装置和提取方法

摘要

A wiring model library constructing method includes: obtaining a correction value of wiring widths on the basis of a plurality of first wiring area ratios and a first wiring film thickness of a plurality of first subject wirings in a plurality of first test wiring patterns each having the first subject wiring and a plurality of first peripheral wrings and being different in the wiring width and wiring interval from each other, obtaining a relationship between the wiring film thickness and the corrected wiring area ratio on the basis of a plurality of second wiring area ratios corrected with the correction value and a second wiring film thickness of a plurality of second subject wirings in a plurality of patterns including at least one of a plurality of inner patterns in each of a plurality of second test wiring patterns including the plurality of first inner patterns each having the second subject wiring and a plurality of second peripheral wirings and being different in the wiring width and wiring interval from each other, and storing data indicative of a relationship of the correction value, the wiring thickness, and the corrected wiring area ratio in association with the wiring width in a storage unit.
机译:布线模型库的构建方法包括:基于多个第一测试布线图案中的多个第一测试布线图案中的多个第一布线面积比和多个第一对象布线的第一布线膜厚,获得布线宽度的校正值。第一对象布线和多个第一外围布线,并且布线宽度和布线间隔彼此不同,从而基于校正后的多个第二布线面积比,获得布线膜厚与校正后的布线面积比之间的关系。具有多个第二对象布线的校正值和第二布线膜厚度,所述多个第二对象布线具有多个图案,所述多个图案包括多个内部测试图案中的至少一个,所述多个内部测试图案中的每个包括多个内部第一图案中的至少一个具有第二对象配线和多个第二外围配线,并且配线宽度不同配线间隔与配线间隔彼此对应,并将表示校正值,配线厚度和配线面积比例与配线宽度的关系的数据存储在存储部中。

著录项

  • 公开/公告号US2009228854A1

    专利类型

  • 公开/公告日2009-09-10

    原文格式PDF

  • 申请/专利权人 HIDEO SAKAMOTO;

    申请/专利号US20090379765

  • 发明设计人 HIDEO SAKAMOTO;

    申请日2009-02-27

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 19:33:49

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号