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AUTOMATED OPTIMIZATION OF DEVICE STRUCTURE DURING CIRCUIT DESIGN STAGE

机译:电路设计阶段的设备结构自动优化

摘要

A method of improving a circuit design for a very large scale integrated circuit is provided which represents a plurality of semiconductor devices interconnected in a circuit. It is determined whether an edge of a feature of one of the plurality of semiconductor devices in the design can be moved in a first direction by a distance within a permitted range, such that a performance goal and a matching goal for the circuit are served. If so, the edge is moved in the first direction by the distance calculated to best serve the performance goal and the matching goal. The foregoing steps may be repeated for each of the plurality of semiconductor devices. If necessary, the foregoing steps may be repeated until the performance goal and matching goal for the circuit are deemed to be adequately served.
机译:提供了一种改进用于超大规模集成电路的电路设计的方法,该方法表示在电路中互连的多个半导体器件。确定是否可以将设计中的多个半导体器件中的一个的特征的边缘沿第一方向移动允许范围内的距离,从而达到电路的性能目标和匹配目标。如果是这样,则沿第一方向移动边缘的距离,该距离应计算为最适合性能目标和匹配目标的距离。可以针对多个半导体器件中的每个重复前述步骤。如果必要,可以重复前述步骤,直到认为电路的性能目标和匹配目标被充分满足为止。

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