首页> 外国专利> Rapid spatial averaging over an extended sample in a Raman spectrometer

Rapid spatial averaging over an extended sample in a Raman spectrometer

机译:在拉曼光谱仪中对扩展样本进行快速空间平均

摘要

An optical method and apparatus is utilized to provide rapid spatial averaging over a large sample area in a Raman spectrometer, without defocusing of the optical source or the collection optics. Spatial averaging provides a representative spectrum of a sample that is inhomogeneous, either in its composition or surface characteristics. The spatial averaging configurations and methods disclosed herein also reduce sample degradation or burning resulting from the high intensity of the directed optical source. Moreover, the dimensions of the sample area of the spatial averaging methods and configurations of the present invention are adjusted to match specific sampling requirements.
机译:利用光学方法和装置在拉曼光谱仪中的大样本区域上提供快速的空间平均,而不会使光源或收集光学器件散焦。空间平均为样品的组成或表面特性提供了不均匀的代表性光谱。本文公开的空间平均配置和方法还减少了由定向光源的高强度导致的样品降解或燃烧。此外,调整本发明的空间平均方法和配置的样本区域的尺寸以匹配特定的采样要求。

著录项

  • 公开/公告号US7595873B1

    专利类型

  • 公开/公告日2009-09-29

    原文格式PDF

  • 申请/专利权人 FRANCIS J. DECK;

    申请/专利号US20080029427

  • 发明设计人 FRANCIS J. DECK;

    申请日2008-02-11

  • 分类号G01J3/44;G01N21/65;

  • 国家 US

  • 入库时间 2022-08-21 19:31:36

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