首页> 外国专利> Sub-wavelength low-noise infrared detectors

Sub-wavelength low-noise infrared detectors

机译:亚波长低噪声红外探测器

摘要

In one of various embodiments, a detector assembly is provided which includes a metallic layer having a repeating pattern of structures over a dielectric substrate. The metallic layer in conjunction with the dielectric substrate form a structure capable of focusing incident radiation to sub-wavelength high field regions. A plurality of detectors are disposed within the dielectric substrate in the high field regions created by the metallic layer. In some embodiments, an array of subwavelength sized detectors may be located in the high field regions.
机译:在各种实施例中的一个中,提供了一种检测器组件,该检测器组件包括金属层,该金属层具有在介电基板上的结构的重复图案。金属层与介电基板一起形成能够将入射辐射聚焦到亚波长高场区域的结构。多个检测器在由金属层产生的高场区域中设置在介电基板内。在一些实施例中,亚波长尺寸的探测器的阵列可以位于高场区域中。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号