首页> 外国专利> Phase-diversity wavefront sensor

Phase-diversity wavefront sensor

机译:相分集波前传感器

摘要

A measuring apparatus provides data relating to the shape of an input radiation wavefront, the wavefront shape being describable at a pre-determined location in an optical system. The apparatus includes an aberration device which provides an aberration to the input radiation wavefront, the shape of which is defined by a filter function that is complex valued and has non-mixed symmetry, and a detector having a radiation sensitive surface capable of detecting the intensity of incident radiation on the surface, the detector being coupled to an output device that provides a measure of the intensity of the incident radiation. The aberration device is configured to act on an input wavefront shape to produce first and second output radiation signals that are detected by the detector and in combination cause the output device to provide data indicating an extent to which the wavefront shape is non-planar.
机译:测量设备提供与输入辐射波前的形状有关的数据,该波前的形状可在光学系统中的预定位置处描述。该设备包括:像差装置,该像差装置向输入的辐射波前提供像差,该像差的形状由复值且具有非混合对称性的滤波函数限定;以及具有能够检测强度的辐射敏感表面的检测器。对于表面上的入射辐射,检测器耦合到输出设备,该输出设备提供入射辐射强度的度量。像差设备被配置为作用于输入波阵面形状,以产生由检测器检测到的第一和第二输出辐射信号,并结合使输出设备提供指示波阵面形状不平坦的程度的数据。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号