Methodology for the configuration and repair of unreliable switching elements

摘要

A universal logic gate apparatus is disclosed, which include a plurality of self-assembling chains of nanoparticles having a plurality of resistive connections, wherein the plurality of self-assembling chains of nanoparticles comprise resistive elements. A plasticity mechanism is also provided, which is based on a plasticity rule for creating stable connections from the plurality of self-assembling chains of nanoparticles for use with the universal, reconfigurable logic gate. In addition, the universal logic gate can be configured with a cross-bar architecture, where nanoconnections are formed from a columbic-educed mechanical stress contact.