首页> 外国专利> Rapid interconnect and logic testing of FPGA device

Rapid interconnect and logic testing of FPGA device

机译:FPGA器件的快速互连和逻辑测试

摘要

A FPGA device that includes a plurality of programmable logic blocks connected to each other through interconnect resources, one or more sets of registers connected to the interconnect resources for configuring the programmable logic blocks. Additional logic is provided with the registers for selecting an interconnect/logic block testing mode thereby enabling a rapid interconnect/logic testing.
机译:一种FPGA器件,包括:通过互连资源彼此连接的多个可编程逻辑块;连接至互连资源的一组或多组寄存器,用于配置可编程逻辑块。寄存器提供了附加逻辑,用于选择互连/逻辑块测试模式,从而实现快速的互连/逻辑测试。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号