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Bessel beam interferometer and measurement method

机译:贝塞尔光束干涉仪及其测量方法

摘要

A measurement method and apparatus rely upon the coherent optical interference between a reference beam and a diffractionless sensing beam having an optical path length that has been disturbed. The interference pattern can be analyzed to determine a measurement parameter of the disturbance. The diffractionless beam is particularly a Bessel beam. Exemplary optical interferometer types including Mach-Zehnder, Michelson, Sagnac and Fabry-Perot include a Bessel beam generator to generate a diffractionless beam as the sensing optical beam and in some aspects the reference optical beam of the interferometer. The sensing optical beam propagates along a sensing optical beam path in free-space. The reference optical beam path may be a free-space medium or a material medium such as an optical fiber. The sensing optical beam path is subject to a disturbance manifested by the optical interference pattern between the sensing optical beam and the reference optical beam. Parameters of the disturbance, such as motion, acoustics, environmental conditions and others can be determined by analysis of the interference pattern.
机译:测量方法和设备依赖于参考光束和具有被干扰的光路长度的无衍射感测光束之间的相干光学干涉。可以分析干扰图案以确定干扰的测量参数。无衍射光束特别是贝塞尔光束。包括Mach-Zehnder,Michelson,Sagnac和Fabry-Perot的示例性光学干涉仪类型包括贝塞尔光束发生器,以产生无衍射光束作为感测光束,并且在某些方面产生干涉仪的参考光束。感测光束在自由空间中沿着感测光束路径传播。参考光束路径可以是自由空间介质或诸如光纤的材料介质。感测光束路径遭受由感测光束和参考光束之间的光学干涉图案所表现出的干扰。干扰参数,例如运动,声学,环境条件等,可以通过分析干涉图来确定。

著录项

  • 公开/公告号US7557930B2

    专利类型

  • 公开/公告日2009-07-07

    原文格式PDF

  • 申请/专利权人 WALTER V. WERNER;PARK E. HAYS;

    申请/专利号US20040996930

  • 发明设计人 PARK E. HAYS;WALTER V. WERNER;

    申请日2004-11-23

  • 分类号G01B11/02;G01B9/02;

  • 国家 US

  • 入库时间 2022-08-21 19:29:47

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