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Anchoring, by lateral oxidizing, of patterns of a thin film to prevent the dewetting phenomenon

机译:通过横向氧化固定薄膜的图案,以防止出现湿润现象

摘要

The invention relates to a thin film having a thickness of less than 10 nm, made of oxidizable semi-conductor material and patterned in the form of patterns. To prevent the dewetting phenomenon of said patterns, lateral oxidized zones are arranged at the periphery of each pattern of the thin film so as to form an anchoring.;This anchoring can be achieved by forming an oxide layer over the whole of the thin film and then depositing a nitride layer. Then the nitride and oxide layers and the thin film are patterned and the thin film is laterally oxidized so that each pattern of the thin film comprises, at the periphery thereof, an oxidized zone of predetermined width. The nitride and oxide layers are then removed so as to release the patterns oxidized at their periphery.
机译:本发明涉及一种厚度小于10nm的薄膜,该薄膜由可氧化的半导体材料制成并且以图案的形式被图案化。为了防止所述图案的去湿现象,在薄膜的每个图案的外围布置侧向氧化区以形成锚定。可以通过在整个薄膜上形成氧化层来实现该锚定。然后沉积氮化物层。然后,对氮化物和氧化物层以及薄膜进行构图,并且将薄膜横向氧化,使得薄膜的每个图案在其外围包括预定宽度的氧化区域。然后去除氮化物和氧化物层,以释放在其外围氧化的图案。

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