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Condenser zone plate illumination for point X-ray sources
Condenser zone plate illumination for point X-ray sources
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机译:点X射线源的聚光镜带片照明
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摘要
An improved short-wavelength microscope is described in which a specimen sample is placed between a condenser zone plate lens and an objective zone plate lens so that the specimen is aligned with a diffraction order of the condenser zone plate lens that is greater than one and proximal to the condenser zone plate.
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