首页> 外国专利> Methods and systems for characterising and optimising immersion lithographic processing

Methods and systems for characterising and optimising immersion lithographic processing

机译:表征和优化浸没式光刻工艺的方法和系统

摘要

A method is provided for characterizing an immersion lithography process of a device using an immersion liquid. In order to study pre-soak and post-soak effects on the image performance of an immersion lithography process, the method includes determining at least one image performance characteristic as function of contact times between the immersion liquid and the device for a device illuminated in a dry lithography process and contacted with said immersion liquid prior and/or after said illumination. Based on the image performance characteristic, a lithography process characteristic is derived for the immersion lithography process.
机译:提供一种用于表征使用浸没液体的器件的浸没光刻工艺的方法。为了研究浸泡前和浸泡后对浸没式光刻工艺的图像性能的影响,该方法包括确定至少一个图像性能特征,作为浸没液体与用于被照明的设备的设备之间的接触时间的函数。干燥光刻工艺并在所述照射之前和/或之后与所述浸没液体接触。基于图像性能特性,得出用于浸没式光刻工艺的光刻工艺特性。

著录项

  • 公开/公告号US7528387B2

    专利类型

  • 公开/公告日2009-05-05

    原文格式PDF

  • 申请/专利权人 IVAN POLLENTIER;

    申请/专利号US20050322090

  • 发明设计人 IVAN POLLENTIER;

    申请日2005-12-29

  • 分类号A61N5/00;

  • 国家 US

  • 入库时间 2022-08-21 19:29:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号