Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices

摘要

A method performs automated at-speed testing of devices. The method includes the steps of generating multiplexer control signals, forming various signal paths between a set of multiplexers and the devices based on the multiplexer control signals, and routing test signals having multiple gigabit per second (MGBPS) baud rates through the signal paths.