Programming of configuration serial EEPROM via an external connector

摘要

The present invention is directed to providing configuration data to an EEPROM within a sealed enclosure without having to open the enclosure, using a Test Interface Card (TIC) connected to a particular external multi-use port on the enclosure. The present invention is generally applicable to any sealed enclosure containing a device that receives information through an internal serial bus, where the enclosure includes ports that have both high speed, low voltage connections and lower speed DC connections. DC blocking capacitors are placed on the high speed lines, and when a TIC is inserted into the multi-use port, a voltage detection circuit coupled to the high speed connections detects a DC control voltage, tri-states a Switch On a Chip (SOC) and configures switches to connect the lower speed connections to the serial bus and an EEPROM so that the TIC can supply new configuration data to the EEPROM.