ELECTRONIC COMPONENT TESTING APPARATUS, ELECTRONIC COMPONENT TESTING SYSTEM AND ELECTRONIC COMPONENT TESTING METHOD

摘要

An electronic component testing apparatus is provided with a first reversing apparatus (220) and a pressing apparatus (250). The reversing apparatus places a customer tray (5) and a contact plate (6A), which is exclusively used for testing, one over another, and reverses them just before testing an IC device so as to transfer the IC device from the customer tray (5) to the contact plate (6A). The pressing apparatus presses the IC device to a socket (41) of the test head (4) in a status where the IC device is held to the contact plate (6A).