首页> 外国专利> HIGH-STRENGTH COLUMNAR CRYSTAL SILICON AND PLASMA ETCHING DEVICE PART FORMED BY THE HIGH-STRENGTH COLUMNAR CRYSTAL SILICON

HIGH-STRENGTH COLUMNAR CRYSTAL SILICON AND PLASMA ETCHING DEVICE PART FORMED BY THE HIGH-STRENGTH COLUMNAR CRYSTAL SILICON

机译:高强度柱状晶体硅和以高强度柱状晶体硅构成的等离子体刻蚀装置

摘要

Provided is a columnar crystal silicon having a high strength. Plasma etching device parts such as a focus ring, an upper electrode plate, and shield ring are formed from a high-strength columnar crystal silicon ingot having an interstitial oxygen concentration within a range of 1 x 1018 to 2 x 1018 atms/cm3. These parts can further increase their diameters without increasing their thicknesses.
机译:提供具有高强度的柱状晶体硅。等离子蚀刻装置的部件例如聚焦环,上部电极板和屏蔽环由间隙氧浓度在1×1018至2×1018atm / cm 3范围内的高强度柱状晶体硅锭形成。这些部件可以进一步增加其直径,而无需增加其厚度。

著录项

  • 公开/公告号WO2009017221A1

    专利类型

  • 公开/公告日2009-02-05

    原文格式PDF

  • 申请/专利权人 MITSUBISHI MATERIALS CORPORATION;SASAKI JUNICHI;

    申请/专利号WO2008JP63863

  • 发明设计人 SASAKI JUNICHI;

    申请日2008-08-01

  • 分类号H01L21/3065;C01B33/02;C30B29/06;

  • 国家 WO

  • 入库时间 2022-08-21 19:20:40

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号