首页> 外国专利> LASER SCANNING MEASUREMENT SYSTEMS AND METHODS FOR SURFACE SHAPE MEASUREMENT OF HIDDEN SURFACES

LASER SCANNING MEASUREMENT SYSTEMS AND METHODS FOR SURFACE SHAPE MEASUREMENT OF HIDDEN SURFACES

机译:激光扫描测量系统和隐蔽表面形状测量方法

摘要

Laser scanning measurement systems and methods are disclosed that allow for surface shape measurements of otherwise hidden portions of an object's surface. The system includes a laser system that scans a laser beam over a scan path, a photodetector that detects light reflected from the object's surface, and a processor adapted to process detector signals from the photodetector to determine a two-dimensional (2D) surface shape representation and a three-dimensional (3D) surface shape profile representation. The system includes a mirror(s) configured to direct the scanned laser beam to one or more portions of the object surface that cannot be directly irradiated by the laser, and that allows the photodetector to detect light reflected from the one or more hidden portions via the mirror(s). The laser scanning measurement system is able to measure, in a single laser beam scan, some or all of the hidden portion(s) of an object rather having to rotate the object or having to use multiple scanned laser beams or multiple scanning systems.
机译:公开了允许对物体表面的其他隐藏部分进行表面形状测量的激光扫描测量系统和方法。该系统包括在扫描路径上扫描激光束的激光系统,检测从物体表面反射的光的光电检测器以及适于处理来自光电检测器的检测器信号以确定二维(2D)表面形状表示的处理器和三维(3D)表面形状轮廓表示。该系统包括反射镜,该反射镜被配置为将扫描的激光束引导到不能被激光直接照射的物体表面的一个或多个部分,并允许光电检测器经由一个或多个隐藏部分检测反射的光。镜子。激光扫描测量系统能够在单次激光束扫描中测量物体的部分或全部隐藏部分,而不必旋转物体或必须使用多个扫描的激光束或多个扫描系统。

著录项

  • 公开/公告号WO2009058247A1

    专利类型

  • 公开/公告日2009-05-07

    原文格式PDF

  • 申请/专利权人 CORNING INCORPORATED;ZOELLER LEON R. III;

    申请/专利号WO2008US12194

  • 发明设计人 ZOELLER LEON R. III;

    申请日2008-10-28

  • 分类号G01B11/24;G01N21/952;

  • 国家 WO

  • 入库时间 2022-08-21 19:19:01

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