首页> 外国专利> PHOTOTRANSISTORS, METHODS OF MAKING PHOTOTRANSISTORS, AND METHODS OF DETECTING LIGHT

PHOTOTRANSISTORS, METHODS OF MAKING PHOTOTRANSISTORS, AND METHODS OF DETECTING LIGHT

机译:光敏电阻器,制造光敏电阻器的方法和检测光的方法

摘要

A phototransistor ( 400 ) comprises an emitter ( 43 ) comprising antimony, a base ( 42 ) comprising antimony, and a collector ( 41 ) comprising antimony. Preferably, the emitter, the base and the collector each comprises at least one of AlInGaAsSb, AlGaAsSb, AlGaSb, GaSb and InGaAsSb. The base comprises an emitter-contacting portion ( 41 b) with a base-contacting portion ( 43 a) of the emitter. The collector comprises a base-contacting portion ( 41 b) which is in contact with a collector-contacting portion ( 421 a) of the base. The phototransistor produces an internal gain upon being contacted with light within a receivable wavelength range, preferably greater than 1.7 micrometers. Also, a method of detecting light using such a phototransistor.
机译:光电晶体管(400)包括包含锑的发射极(43),包含锑的基极(42)和包含锑的集电极(41)。优选地,发射极,基极和集电极各自包括AlInGaAsSb,AlGaAsSb,AlGaSb,GaSb和InGaAsSb中的至少一种。基部包括发射极接触部分(41b),发射极接触部分(41b)具有发射极的基极接触部分(43a)。集电体包括与基体的集电体接触部分(421a)接触的基体接触部分(41b)。光电晶体管在与可接收波长范围(最好大于1.7微米)内的光接触时产生内部增益。同样,一种使用这种光电晶体管检测光的方法。

著录项

  • 公开/公告号EP1719188A4

    专利类型

  • 公开/公告日2009-02-25

    原文格式PDF

  • 申请/专利权人 ADVANCED OPTICAL MATERIALS LLC;

    申请/专利号EP20050711850

  • 发明设计人 SULIMA OLEG;

    申请日2005-01-24

  • 分类号H01L31/11;H01L31/0304;H01L31/0328;H01L31/06;

  • 国家 EP

  • 入库时间 2022-08-21 19:18:06

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