SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC MEASURING INSTRUMENT, DATA PROCESSING DEVICE AND PROGRAM

摘要

Provided are a spectral characteristic measuring system, a spectral characteristic measuring instrument, a data processing device and a program which enable the appropriate correction of the influence of change of illumination light caused by the temperature increase of a semiconductor light-emitting element such as an LED due to light emission, for example, in a scanning color measuring system for continuously measuring multiple color samples 1n in which a reference system is omitted with the semiconductor light-emitting element as a light source. A spectral distribution of illumination light of when a spectral distribution of a color sample is obtained is estimated by interpolating spectral distributions of the illumination light measured before and after the measurement of the color sample, and the spectral characteristic of the color sample is specified on the basis of a spectral distribution of reflected light or transmitted light from the color sample and the estimated spectral distribution.