首页> 外国专利> APPRATUS FOR SAWING A WAFER HAVING A NOZZLE ELIMINATING A METAL BURR IN A SCRIBE LANE, METHOD OF SAWING THE WAFER AND SEMICONDUCTOR PACKAGE FABRICATED THEREBY THE SAME

APPRATUS FOR SAWING A WAFER HAVING A NOZZLE ELIMINATING A METAL BURR IN A SCRIBE LANE, METHOD OF SAWING THE WAFER AND SEMICONDUCTOR PACKAGE FABRICATED THEREBY THE SAME

机译:用于在格栅车道上锯切具有喷嘴以消除金属毛刺的晶片的装置,锯切晶片的方法以及由此制造的半导体封装

摘要

An apparatus for sawing a wafer having a nozzle eliminating a metal burr in a scribe lane, method of sawing the wafer and semiconductor package fabricated thereby the same are provided to remove the metal protrusion and to prevent the short circuit of the wire bonding or the circuit board. The cutting blade(110) cuts the wafer(120) in order to partition the main chip(122) and moves to the predetermined progressive direction along the sawing lane in the scribe-lane(124) including the metal pad. The wafer sawing apparatus(100) comprises one or more protrusion removal nozzle(118) which has the predetermined angle of injection pattern in order to remove the protrusion of the metal pad passing through the cutting blade in the scribe-lane.
机译:提供一种用于切割具有在划线道中消除了金属毛刺的喷嘴的晶片的设备,一种切割晶片的方法以及由此制造的半导体封装,以去除金属突起并防止引线键合或电路的短路。板。切割刀片(110)切割晶片(120)以便划分主芯片(122),并且沿着包括金属垫的划线(124)中的锯切道(sawing lane)向预定的前进方向移动。晶片锯切设备(100)包括一个或多个突起去除喷嘴(118),该突起去除喷嘴(118)具有预定的喷射角度,以便去除穿过划线道中穿过切割刀片的金属垫的突起。

著录项

  • 公开/公告号KR20090024408A

    专利类型

  • 公开/公告日2009-03-09

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20070089409

  • 发明设计人 HONG JI SUN;MOK SEUNG KON;KIM TAE HUN;

    申请日2007-09-04

  • 分类号H01L21/301;H01L21/78;

  • 国家 KR

  • 入库时间 2022-08-21 19:13:52

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