首页> 外国专利> SAMPLE MANUFACTURING SYSTEM, USED IN ANALYZING FINE STRUCTURE THROUGH A MICROSCOPE TO SOLVE VARIOUS PROBLEMS

SAMPLE MANUFACTURING SYSTEM, USED IN ANALYZING FINE STRUCTURE THROUGH A MICROSCOPE TO SOLVE VARIOUS PROBLEMS

机译:样品制造系统,用于通过显微镜分析精细结构来解决各种问题

摘要

PURPOSE: A sample manufacturing system is provided to prevent a tool from being polished when polishing samples by hardening the surface of a lower end of a polishing tool and improving abrasion resistance.;CONSTITUTION: A sample manufacturing system comprises a sample fixing block, a sample thickness adjustment tool, and a holder. A sample fixing block(14) directly fixes a mount(12) in which a sample(11) is fixed using a mounting hole(10a) of a center part or indirectly fixes the mount through a holder(13). A sample thickness adjustment tool(15) is coupled on the sample fixing block and pushes the mount including the sample. The holder is accepted inside the mounting hole and fixes the mount in which the sample is fixed using a mounting hole(10b).;COPYRIGHT KIPO 2010
机译:目的:提供了一种样品制造系统,以通过硬化抛光工具下端的表面并提高耐磨性来防止在抛光样品时对工具进行抛光。组成:样品制造系统包括样品固定块,样品厚度调整工具和一个支架。样本固定块(14)直接固定其中利用中央部分的安装孔(10a)固定样本(11)的底座(12),或者通过支架(13)间接固定底座。样品厚度调节工具(15)连接在样品固定块上,并推动包括样品的安装座。支架被接纳在安装孔内,并使用安装孔(10b)固定用于固定样品的安装座。; COPYRIGHT KIPO 2010

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