首页> 外国专利> METHOD OF MANUFACTURING FINE STRUCTURE, FINE STRUCTURE, DEVICE FOR RAMAN SPECTRUM, RAMAN SPECTROMETER, ANALYZING DEVICE, DETECTION DEVICE AND MASS SPECTROMETER

METHOD OF MANUFACTURING FINE STRUCTURE, FINE STRUCTURE, DEVICE FOR RAMAN SPECTRUM, RAMAN SPECTROMETER, ANALYZING DEVICE, DETECTION DEVICE AND MASS SPECTROMETER

机译:制造精细结构,精细结构,拉曼光谱仪,拉曼光谱仪,分析装置,检测装置和质谱仪的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing a fine structure which enables easy production of a fine structure capable of forming a hot spot near metal fine particles without a step of densely disposing the metal fine particles with several-ten-nm or smaller gap therebetween.;SOLUTION: The method of manufacturing a fine structure is characterized by a step of dispersing and fixing the plurality of metal fine particles having a size capable of inducing localized plasmon on a surface of a substrate, a step of forming a metal film in a gap between the plurality of metal fine particles, wherein the metal fine particles have a portion in which an area of a cross-section of a cut face parallel to a surface of the substrate gets maximum, and have a shape such that the cross-sectional area reduces toward the surface of the substrate from the portion in which the cross-sectional area gets maximum, and wherein the metal fine particles get spaced apart from the metal film.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种精细结构的制造方法,该方法能够容易地制造能够在金属微粒附近形成热点的精细结构,而无需密集地布置几十纳米或更小的金属微粒的步骤。解决方案:精细结构的制造方法的特征在于以下步骤:将多个具有能够在基板表面上引起局部等离子体激元的尺寸的金属细颗粒分散并固定;形成金属膜的步骤。在多个金属细颗粒之间的间隙中,金属细颗粒具有与平行于基板的表面的切割面的横截面的面积最大的部分,并且具有使得交叉的形状。截面积从截面积最大的部分朝着衬底的表面减小,并且其中金属细颗粒与金属膜间隔开。电话:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009109395A

    专利类型

  • 公开/公告日2009-05-21

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORP;

    申请/专利号JP20070283290

  • 发明设计人 RI SHIZUNAMI;MURAKAMI NAOKI;

    申请日2007-10-31

  • 分类号G01N21/65;G01N27/64;B82B3/00;B82B1/00;H01J49/16;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:56

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