With the present invention is to provide a device and a method for the investigation of surface properties of different types of materials are provided, with which it is possible, the screens - force - microscopy with a simplified and more rapid shear - force - to carry out the method, whereby also a parallel operation of a plurality of cantilever simple to realize and the crosstalk of the actuator - and sensor signals is to be reduced.The device according to the invention is characterized by a vertical alignment of the connection itself which cantilever with their measuring tips to the samples - surface, by a galvanic separation of the piezoresistive sensor and of the bimorph - actuator and by the design of the measuring tip acting as a carbon nanotube -.According to the invention, a cantilever - array is formed by a comb-like arrangement of individual of pre-bent cantilever characterized.The method according to the invention is characterized by a rapid feed - back - signal, by virtue of the adjustment of the distance between the test prod and of the surface to be examined by means of the change of the dc signal.
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