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Method for testing integrated circuit, involves receiving and evaluating switching characteristic of integrated circuit, particularly switch-on characteristic
Method for testing integrated circuit, involves receiving and evaluating switching characteristic of integrated circuit, particularly switch-on characteristic
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机译:测试集成电路的方法,包括接收和评估集成电路的开关特性,特别是接通特性
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摘要
The method involves modifying a pre-determined component internal voltage generator network, in such a manner that the response of a pre-determined component-internal voltage generator of the voltage generator network is affected. The switching characteristic of the integrated circuit, particularly the switch-on characteristic of the integrated circuit is received and evaluated. Independent claims are also included for the following: (1) a system for testing an integrated circuit (2) an integrated circuit.
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