首页> 外国专利> Method for the interferometric determination of an optical wavelength between the surface of an object and a reference surface comprises directing the coherent electromagnetic wave front onto the surface of the object

Method for the interferometric determination of an optical wavelength between the surface of an object and a reference surface comprises directing the coherent electromagnetic wave front onto the surface of the object

机译:用于干涉测量物体表面和参考表面之间的光波长的方法,包括将相干电磁波前导引导到物体表面上

摘要

Method for the interferometric determination of an optical wavelength between the surface (P) of an object (O) and a reference surface (R) comprises directing the coherent electromagnetic wave front onto the surface of the object at a small angle (alpha ) to the optical axis (6). An independent claim is also included for an interferometer arrangement. Preferred Features: The reference surface is formed as a planar surface. The method is carried out in a common-path arrangement. The coherent electromagnetic wave front is monochromatic.
机译:用于干涉测量物体(O)的表面(P)和参考表面(R)之间的光波长的方法,包括将相干电磁波前向与物体的表面成小角度(α)的方向引导到物体的表面上。光轴(6)。干涉仪装置也包括独立权利要求。优选特征:参考表面形成为平面。该方法以公共路径布置来执行。相干电磁波波前是单色的。

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