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Cleaning module, particularly for extreme-ultraviolet lithography apparatus, has supply for molecular hydrogen, where atomic hydrogen generating device is provided

机译:清洁模块,特别是用于极紫外光刻设备的清洁模块,具有分子氢的供应,其中设有原子氢产生装置

摘要

The cleaning module has a supply (206) for molecular hydrogen, where an atomic hydrogen generating device is provided. A discharge (212) is provided for atomic or molecular hydrogen. The discharge has a curvature with a curvature angle of less than 120 degrees. The inner surface of the discharge is made of a material, where polytetrafluoroethylene or phosphoric acid is provided on silica. Independent claims are included for the following: (1) an extreme-ultraviolet lithography apparatus; and (2) a projection system for extreme-ultraviolet lithography apparatus.
机译:清洁模块具有用于分子氢的供应(206),其中提供了原子氢产生装置。提供用于原子或分子氢的放电(212)。放电具有曲率角小于120度的曲率。放电的内表面由在二氧化硅上提供聚四氟乙烯或磷酸的材料制成。以下内容包括独立权利要求:(1)一种极紫外光刻设备; (2)用于极紫外光刻设备的投影系统。

著录项

  • 公开/公告号DE102008000959A1

    专利类型

  • 公开/公告日2009-10-08

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20081000959

  • 发明设计人 EHM DIRK HEINRICH;KALLER JULIAN;

    申请日2008-04-03

  • 分类号G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:20

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