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cycles in hdp cvd cannot conserve the infill with high aspect ratio

机译:hdp cvd中的循环无法保存高纵横比的填充

摘要

A method and apparatus are disclosed for depositing a dielectric film in a gap having an aspect ratio at least as large as 6:1. By cycling the gas chemistry of a high-density-plasma chemical-vapor-deposition system between deposition and etching conditions, the gap may be substantially 100% filled. Such filling is achieved by adjusting the flow rates of the precursor gases such that the deposition to sputtering ratio during the deposition phases is within certain predetermined limits. IMAGE
机译:公开了一种用于在具有至少为6:1的纵横比的间隙中沉积介电膜的方法和设备。通过在沉积和蚀刻条件之间循环高密度等离子体化学气相沉积系统的气体化学,该间隙可以基本上100%被填充。这种填充是通过调节前体气体的流速来实现的,以使得在沉积阶段期间的沉积与溅射之比在某些预定极限内。 <图像>

著录项

  • 公开/公告号DE60136891D1

    专利类型

  • 公开/公告日2009-01-22

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC.;

    申请/专利号DE20016036891T

  • 发明设计人 KWAN MICHAEL CHIU;LIU ERIC;

    申请日2001-08-10

  • 分类号C23C16/04;H01L21/205;C23C16/40;C23C16/44;C23C16/455;C23C16/517;C23C16/52;H01J37/32;H01L21/3065;H01L21/316;H01L21/76;H01L21/768;H01L21/8242;H01L27/108;

  • 国家 DE

  • 入库时间 2022-08-21 19:08:25

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