首页> 外国专利> AlxGa(1-x)As SUBSTRATE, EPITAXIAL WAFER FOR INFRARED LED, INFRARED LED, METHOD FOR PRODUCTION OF AlxGa(1-x)As SUBSTRATE, METHOD FOR PRODUCTION OF EPITAXIAL WAFER FOR INFRARED LED, AND METHOD FOR PRODUCTION OF INFRARED LED

AlxGa(1-x)As SUBSTRATE, EPITAXIAL WAFER FOR INFRARED LED, INFRARED LED, METHOD FOR PRODUCTION OF AlxGa(1-x)As SUBSTRATE, METHOD FOR PRODUCTION OF EPITAXIAL WAFER FOR INFRARED LED, AND METHOD FOR PRODUCTION OF INFRARED LED

机译:以AlxGa(1-x)为底物的红外线LED的晶片,红外LED,生产AlxGa(1-x)为底物的方法,红外LED的晶片的制造方法以及红外LED的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a method for production of an AlxGa(1-x)As (0x1) substrate which can keep its transmission property at a high level and enables the production of a device having excellent properties.;SOLUTION: The AlxGa(1-x)As substrate 10a is specifically disclosed as the AlxGa(1-x)As (0x1) substrate 10a which is characterized by comprising an AlxGa(1-x)As layer 11 having a main surface 11a and a rear surface 11b opposite to the main surface 11a, wherein the content x of Al in the rear surface 11b is higher than that in the main surface 11a in the AlxGa(1-x)As layer 11. The AlxGa(1-x)As substrate 10a may additionally comprise a GaAs substrate 13 which is arranged adjacent to the rear surface 11b of the AlxGa(1-x)As layer 11.;COPYRIGHT: (C)2011,JPO&INPIT
机译:要解决的问题:提供一种可以保持高传输特性的Al x Ga (1-x) As(0x1)衬底的制造方法解决方案:将Al x Ga (1-x) As衬底10a具体公开为Al x Ga (1-x) As(0x1)衬底10a,其特征在于包括Al x Ga (1-x)作为具有主表面11a和与主表面11a相对的后表面11b的层11,其中后表面11b中的Al的含量x高于在Al x中的主表面11a中的Al含量 Ga (1-x) As层11。Al x Ga (1-x) As衬底10a可另外包含GaAs基板13,其与Al x Ga (1-x) As层11的后表面11b相邻布置;版权:(C)2011,JPO&INPIT

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