The test pattern automatic program generation device which creates the failure analysis system, the failure analysis

摘要

PROBLEM TO BE SOLVED: To provide a failure analysis system independent of a format of test data processable by a failure analysis device, capable of suppressing the number of information files used for failure analysis; and also to provide a failure analysis information processing device and a failure analysis method.;SOLUTION: This system is equipped with: a parser part 211 for classifying information included in test data for a test to be applied to the test of an LSI which is a failure analysis object in each kind and generating intermediate data; a fail information addition part 212 for adding fail information acquired from the LSI test using the test data for the test to the intermediate data; a test data generation part 213 for generating test data for the failure analysis based on the intermediate data to which the fail information is added; and a fail information generation part 214 for generating fail information for the failure analysis based on the intermediate data to which the fail information is added.;COPYRIGHT: (C)2007,JPO&INPIT