PROBE OF ELECTRIC MEASURING INSTRUMENT

摘要

PROBLEM TO BE SOLVED: To provide a probe for an electric measuring instrument capable of improving accessibility of the probe to an object to be inspected, and significantly improving degree of correctness of electrical properties information to be measured and inspector's use convenience of the probe.;SOLUTION: The probe is structured so that a handle and at least one loop antenna connected to the handle are included and so that a surface of the loop antenna moves toward an object to be inspected to detect the electrical properties in the vicinity of the object to be inspected.;COPYRIGHT: (C)2010,JPO&INPIT