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DEVICE, KIT, AND METHOD FOR COLLECTING PCB ANALYTICAL SAMPLE, AND METHOD FOR MANAGING PCB ANALYTICAL SAMPLE

机译:用于收集PCB分析样品的装置,套件和方法,以及用于管理PCB分析样品的方法

摘要

PROBLEM TO BE SOLVED: To provide a device and method for collecting a PCB analytical sample, capable of safely and easily collecting the PCB analytical sample from an electric device, and a management method capable of preventing confusion of samples after collection.;SOLUTION: The method for collecting the PCB analytical sample uses the device for collecting the PCB analytical sample 1, which has a vacuum vessel 2 having an elastic cap 2b, a vacuum vessel holder 3 having a hollow needle 5 at the bottom, and a capillary 4 to be connected to the hollow needle 5. The capillary 4 is inserted into a gap in the electric device 10 having an insulation oil 14, a PCB analytical object, the capillary 4 is connected to the hollow needle 5, and the hollow needle 5 pierces the cap 2b of the vacuum vessel 2 in the vacuum vessel holder 3 to collect the insulation oil 14 from inside the electric device 10 into the vacuum vessel 2.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:提供一种用于收集PCB分析样品的设备和方法,能够安全,轻松地从电气设备中收集PCB分析样品,以及一种能够防止收集后样品混淆的管理方法。用于收集PCB分析样品的方法使用用于收集PCB分析样品的设备1,该设备具有:真空容器2,其具有弹性帽2b;真空容器支架3,其底部具有空心针5;毛细管4,其毛细管4被插入到具有绝缘油14,PCB分析物的电气设备10的间隙中,毛细管4被连接到空心针5,并且空心针5刺穿帽盖。真空容器固定器3中的真空容器2的2b,以便将绝缘油14从电气设备10的内部收集到真空容器2中;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010048787A

    专利类型

  • 公开/公告日2010-03-04

    原文格式PDF

  • 申请/专利权人 EHIME UNIV;

    申请/专利号JP20080215944

  • 发明设计人 TOIDA HIDEKI;HONDA KATSUHISA;

    申请日2008-08-25

  • 分类号G01N1/10;

  • 国家 JP

  • 入库时间 2022-08-21 19:01:16

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