首页> 外国专利> Percolating the suffering grinding material other than the aforementioned abrasives from

Percolating the suffering grinding material other than the aforementioned abrasives from

机译:除上述磨料外,还会渗入受磨的磨料

摘要

PROBLEM TO BE SOLVED: To provide an abrasive liquid recycling system for a chemical and mechanical flattening device (hereinafter called a CMP device), capable of keeping the good quality of a machining surface of a semiconductor wafer and the like.;SOLUTION: This abrasive liquid recycling system for the CMP device comprises an abrasive liquid tank 2, a derivation filter 4 provided in the abrasive liquid tank 2, an abrasive liquid supplying line 21 provided with the derivation filter 4 at one end and supplying the abrasive liquid from the abrasive liquid tank 2 into the CMP device 1, an abrasive liquid returning line 22 returning the abrasive liquid from the CMP device 1 to the abrasive liquid tank 2, and an induction filter 3 provided at an end of the abrasive liquid returning line 22 and existing in the abrasive liquid tank 2. Filtering is conducted by the induction filter 3 and the derivation filter 4 in the abrasive liquid tank 2 in stages. The induction filter 3 is made by plural network structure sheets having a different network size, and abrasive articles are filtered and separated by the network structure sheets in stages. The derivation filter 4 filters and separates the abrasive articles that can not be filtered and separated by the induction filter 3.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种用于化学和机械平坦化装置(以下称为CMP装置)的研磨液再循环系统,其能够保持半导体晶片等的加工表面的良好质量。用于CMP装置的液体循环系统包括研磨液罐2,设置在研磨液罐2中的衍生过滤器4,在一端设置有衍生过滤器4并从研磨液供应研磨液的研磨液供应管线21。罐2进入CMP装置1,研磨液返回管线22将研磨液从CMP装置1返回到研磨液罐2,以及感应过滤器3,该感应过滤器3设置在研磨液返回管线22的端部并存在于研磨罐2中。研磨液槽2中的感应过滤器3和微分过滤器4分阶段进行过滤。感应过滤器3由具有不同网络尺寸的多个网络结构片制成,并且磨料被网络结构片分级过滤和分离。衍生过滤器4过滤并分离不能被感应过滤器3过滤和分离的磨料。版权所有:(C)2002,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号