首页> 外国专利> METAL THIN FILM FORMING METHOD FOR MICROSCOPIC OBSERVATION SAMPLE FOR SCANNING ELECTRON MICROSCOPE

METAL THIN FILM FORMING METHOD FOR MICROSCOPIC OBSERVATION SAMPLE FOR SCANNING ELECTRON MICROSCOPE

机译:扫描电子显微镜的显微镜观察样品的金属薄膜形成方法

摘要

PROBLEM TO BE SOLVED: To form a metal thin film with high adhesion onto an electrical insulating sample by a simple method; to emit efficiently secondary electrons by reducing charge of the electrical insulating sample by an electron beam irradiated from a SEM, and to make an emission direction constant, when forming the metal thin film on the surface of the electrical insulating sample to be observed microscopically by the SEM; and to thereby observe microscopically, clearly and highly accurately the surface of the electrical insulating sample.;SOLUTION: Before forming the metal thin film on the surface of the electrical insulating sample, in the state where hydrocarbon gas is introduced into a chamber, a voltage is applied between both electrodes to generate glow discharge, and to thereby ionize a hydrocarbon component, and a hydrocarbon film is formed on the surface of the electrical insulating sample.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:通过简单的方法在电绝缘样品上形成高附着力的金属薄膜;当通过用显微镜观察的电绝缘样品的表面上形成金属薄膜时,通过减少从SEM发射的电子束产生的电绝缘样品的电荷来有效地发射二次电子,并使发射方向恒定。扫描电镜因此,可以在显微镜下,清晰,高度准确地观察电绝缘样品的表面。;解决方案:在电绝缘样品的表面上形成金属薄膜之前,在将碳氢化合物气体引入腔室的状态下,在两个电极之间施加辉光放电以产生辉光放电,从而使碳氢化合物离子化,并在电绝缘样品的表面上形成碳氢化合物膜。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010002355A

    专利类型

  • 公开/公告日2010-01-07

    原文格式PDF

  • 申请/专利权人 FILGEN INC;

    申请/专利号JP20080162706

  • 发明设计人 TAJIMA HARUO;NAKADA MANABU;

    申请日2008-06-23

  • 分类号G01N1/28;C23C16/02;C23C16/14;C23C16/32;H01J37/20;H05H1/46;

  • 国家 JP

  • 入库时间 2022-08-21 18:59:27

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