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Light scattering apparatus, light scattering measurement method, light scattering analysis apparatus and the light scattering measurement analysis

机译:光散射装置,光散射测定方法,光散射分析装置以及光散射测定分析

摘要

PROBLEM TO BE SOLVED: To provide an inexpensive and practical light scattering apparatus and a light scattering measurement/analysis method for measuring a light scattered by an opaque sample and calculating a photon correlation function from time-series data of photon pulses measured by light scattering.;SOLUTION: A control section 190 controls so as to approximate a length of a light path for making a laser light outputted from a laser light source 210 enter into the sample 110, exit from the sample and be scattered as the scattered light to zero. A detector 330 detects the exiting scattered light, and outputs the photon pulses. A pulse interval measuring instrument 350 measures time intervals of the photon pulses outputted from the detector 330. A calculation section of a computer 360 uses the time intervals of the photon pulses measured by the pulse interval measuring instrument 350, and calculates the n-th order correlation function (n≥1).;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种廉价且实用的光散射装置和光散射测量/分析方法,用于测量由不透明样品散射的光并从通过光散射测量的光子脉冲的时间序列数据计算光子相关函数。解决方案:控制部分190进行控制,以近似使从激光源210输出的激光进入样品110,从样品出射并作为散射光散射为零的光路的长度。检测器330检测出射出的散射光,并输出光子脉冲。脉冲间隔测量仪350测量从检测器330输出的光子脉冲的时间间隔。计算机360的计算部使用由脉冲间隔测量仪350测量的光子脉冲的时间间隔,并计算n阶相关函数(n≥ 1).;版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4517145B2

    专利类型

  • 公开/公告日2010-08-04

    原文格式PDF

  • 申请/专利权人 国立大学法人北海道大学;

    申请/专利号JP20040256056

  • 发明设计人 古川 英光;

    申请日2004-09-02

  • 分类号G01N15/02;

  • 国家 JP

  • 入库时间 2022-08-21 18:58:39

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