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Ripple characteristic correction circuit and ripple characteristics correction method

机译:纹波特性校正电路和纹波特性校正方法

摘要

PROBLEM TO BE SOLVED: To reduce influences of ripple less in a circuit.;SOLUTION: In a ripple characteristic correction circuit 10 for measuring ripple in a circuit including a first circuit 12 and a second circuit 14, a control circuit 18 inputs, to the first circuit 12, a plurality of ripple measuring signals of frequencies with respectively different frequency differences from a reference frequency, and a frequency converting unit 16 converts the frequencies of the ripple measuring signals so that a tipple measuring signal outputted from the first circuit 12 becomes the reference frequency, and inputs, to the second circuit 14, the ripple measuring signals to convert frequencies thereof in the frequency converting unit 16. The control circuit 18 then measures an amplitude of a ripple measuring signal outputted from the second circuit 14 and calculates the ripple of the first circuit 12 based on the measured amplitude for each frequency difference.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:为了减少电路中的纹波的影响;解决方案:在用于测量包括第一电路12和第二电路14的电路中的纹波的纹波特性校正电路10中,控制电路18输入到第一电路12,多个具有与基准频率不同的频率差的频率的脉动测量信号,以及频率转换单元16转换脉动测量信号的频率,以使得从第一电路12输出的倾倒测量信号变为参考频率,并将波纹测量信号输入到第二电路14,以在频率转换单元16中对其频率进行转换。然后,控制电路18测量从第二电路14输出的波纹测量信号的幅度,并计算波纹基于每个频率差的测得幅值对第一电路12进行放大;版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4378246B2

    专利类型

  • 公开/公告日2009-12-02

    原文格式PDF

  • 申请/专利权人 京セラ株式会社;

    申请/专利号JP20040250975

  • 发明设计人 巣山 武彦;

    申请日2004-08-30

  • 分类号H04B1/16;H04B1/04;

  • 国家 JP

  • 入库时间 2022-08-21 18:56:53

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