首页> 外国专利> Failure analysis method of peripheral equipment peripheral equipment, and integrated circuits, peripheral equipment

Failure analysis method of peripheral equipment peripheral equipment, and integrated circuits, peripheral equipment

机译:外围设备外围设备的故障分析方法,集成电路,外围设备

摘要

Is connected to the computer 200 via an interface cable (3), peripheral equipment of the present invention, the storage of the second storage evaluation program (400) and (22) the integrated circuit (100) peripheral devices detector which detects the transmitting device (13), the computer (200), mode indication signal or indicate the test mode or indicate the normal mode (10), that the mode instruction signal indicates a test mode detector (10) detects, characterized in that it comprises (15) starting means for starting the evaluation program (13) on a second storage device (22). Therefore, in the case of mounting an integrated circuit on peripheral equipment, it is possible to provide a failure analysis method of the peripheral devices and integrated circuits, and as a possible failure analysis the integrated circuit and peripheral devices, and peripheral devices.
机译:通过接口电缆(3),本发明的外围设备,第二存储评估程序(400)的存储和(22)集成电路(100)外围设备检测器(其检测发送设备)连接到计算机200 (13),计算机(200),模式指示信号或指示测试模式或指示正常模式(10),该模式指示信号指示测试模式检测器(10)检测到,其特征在于包括(15)启动装置,用于在第二存储设备(22)上启动评估程序(13)。因此,在将集成电路安装在外围设备上的情况下,可以提供外围设备和集成电路的故障分析方法,并且可以提供对集成电路和外围设备以及外围设备的故障分析。

著录项

  • 公开/公告号JPWO2008016136A1

    专利类型

  • 公开/公告日2009-12-24

    原文格式PDF

  • 申请/专利权人 パナソニック株式会社;

    申请/专利号JP20080527800

  • 发明设计人 山本 和司;

    申请日2007-08-03

  • 分类号G06F11/22;G11B20/18;G11B20/10;

  • 国家 JP

  • 入库时间 2022-08-21 18:56:55

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号